test/dm: reset: Add reset_get_by_index[_nodev] test
authorJagan Teki <jagan@amarulasolutions.com>
Wed, 27 Feb 2019 18:56:56 +0000 (00:26 +0530)
committerJagan Teki <jagan@amarulasolutions.com>
Wed, 8 May 2019 19:14:13 +0000 (00:44 +0530)
Add sample dm reset test for reset_get_by_index and
reset_get_by_index_nodev functionality code.

Cc: Stephen Warren <swarren@nvidia.com>
Signed-off-by: Jagan Teki <jagan@amarulasolutions.com>
Reviewed-by: Simon Glass <sjg@chromium.org>
test/dm/reset.c

index c02866a2f0a6b0d7f9eccc1f8f6b0c48e2cef65d..c61daed49032b64ebbd0ebaf8a36400dc4ed9f44 100644 (file)
@@ -5,6 +5,7 @@
 
 #include <common.h>
 #include <dm.h>
+#include <reset.h>
 #include <dm/test.h>
 #include <asm/reset.h>
 #include <test/ut.h>
 /* This is the other reset phandle specifier handled by bulk */
 #define OTHER_RESET_ID 2
 
+/* Base test of the reset uclass */
+static int dm_test_reset_base(struct unit_test_state *uts)
+{
+       struct udevice *dev;
+       struct reset_ctl reset_method1;
+       struct reset_ctl reset_method2;
+
+       /* Get the device using the reset device */
+       ut_assertok(uclass_get_device_by_name(UCLASS_MISC, "reset-ctl-test",
+                                             &dev));
+
+       /* Get the same reset port in 2 different ways and compare */
+       ut_assertok(reset_get_by_index(dev, 1, &reset_method1));
+       ut_assertok(reset_get_by_index_nodev(dev_ofnode(dev), 1,
+                                            &reset_method2));
+       ut_asserteq(reset_method1.id, reset_method2.id);
+
+       return 0;
+}
+
+DM_TEST(dm_test_reset_base, DM_TESTF_SCAN_FDT);
+
 static int dm_test_reset(struct unit_test_state *uts)
 {
        struct udevice *dev_reset;