lpc32xx: remove surplus clock cycle in PL175 WAIT_OEN config

[oweals/u-boot.git] / test / dm / regulator.c

diff --git a/test/dm/regulator.c b/test/dm/regulator.c
index c4f14bdac588899bffc4cc5bba8707939969e511..3d0056f2dc7bf13049d4d2c13e711bedf9aa8f77 100644 (file)
--- a/test/dm/regulator.c
+++ b/test/dm/regulator.c
@@ -14,13 +14,13 @@
 #include <malloc.h>
 #include <dm/device-internal.h>
 #include <dm/root.h>
-#include <dm/ut.h>
 #include <dm/util.h>
 #include <dm/test.h>
 #include <dm/uclass-internal.h>
 #include <power/pmic.h>
 #include <power/regulator.h>
 #include <power/sandbox_pmic.h>
+#include <test/ut.h>
 
 DECLARE_GLOBAL_DATA_PTR;
 
@@ -47,7 +47,7 @@ static const char *regulator_names[OUTPUT_COUNT][OUTPUT_NAME_COUNT] = {
 };
 
 /* Test regulator get method */
-static int dm_test_power_regulator_get(struct dm_test_state *dms)
+static int dm_test_power_regulator_get(struct unit_test_state *uts)
 {
        struct dm_regulator_uclass_platdata *uc_pdata;
        struct udevice *dev_by_devname;
@@ -92,7 +92,7 @@ static int dm_test_power_regulator_get(struct dm_test_state *dms)
 DM_TEST(dm_test_power_regulator_get, DM_TESTF_SCAN_FDT);
 
 /* Test regulator set and get Voltage method */
-static int dm_test_power_regulator_set_get_voltage(struct dm_test_state *dms)
+static int dm_test_power_regulator_set_get_voltage(struct unit_test_state *uts)
 {
        struct dm_regulator_uclass_platdata *uc_pdata;
        struct udevice *dev;
@@ -119,7 +119,7 @@ static int dm_test_power_regulator_set_get_voltage(struct dm_test_state *dms)
 DM_TEST(dm_test_power_regulator_set_get_voltage, DM_TESTF_SCAN_FDT);
 
 /* Test regulator set and get Current method */
-static int dm_test_power_regulator_set_get_current(struct dm_test_state *dms)
+static int dm_test_power_regulator_set_get_current(struct unit_test_state *uts)
 {
        struct dm_regulator_uclass_platdata *uc_pdata;
        struct udevice *dev;
@@ -158,7 +158,7 @@ static int dm_test_power_regulator_set_get_current(struct dm_test_state *dms)
 DM_TEST(dm_test_power_regulator_set_get_current, DM_TESTF_SCAN_FDT);
 
 /* Test regulator set and get Enable method */
-static int dm_test_power_regulator_set_get_enable(struct dm_test_state *dms)
+static int dm_test_power_regulator_set_get_enable(struct unit_test_state *uts)
 {
        const char *platname;
        struct udevice *dev;
@@ -177,7 +177,7 @@ static int dm_test_power_regulator_set_get_enable(struct dm_test_state *dms)
 DM_TEST(dm_test_power_regulator_set_get_enable, DM_TESTF_SCAN_FDT);
 
 /* Test regulator set and get mode method */
-static int dm_test_power_regulator_set_get_mode(struct dm_test_state *dms)
+static int dm_test_power_regulator_set_get_mode(struct unit_test_state *uts)
 {
        const char *platname;
        struct udevice *dev;
@@ -196,7 +196,7 @@ static int dm_test_power_regulator_set_get_mode(struct dm_test_state *dms)
 DM_TEST(dm_test_power_regulator_set_get_mode, DM_TESTF_SCAN_FDT);
 
 /* Test regulator autoset method */
-static int dm_test_power_regulator_autoset(struct dm_test_state *dms)
+static int dm_test_power_regulator_autoset(struct unit_test_state *uts)
 {
        const char *platname;
        struct udevice *dev, *dev_autoset;
@@ -210,7 +210,7 @@ static int dm_test_power_regulator_autoset(struct dm_test_state *dms)
         * Expected output state: uV=1200000; uA=200000; output enabled
         */
        platname = regulator_names[BUCK1][PLATNAME];
-       ut_assertok(regulator_autoset(platname, &dev_autoset, false));
+       ut_assertok(regulator_autoset_by_name(platname, &dev_autoset));
 
        /* Check, that the returned device is proper */
        ut_assertok(regulator_get_by_platname(platname, &dev));
@@ -276,7 +276,7 @@ static const struct setting expected_setting_list[] = {
 static int list_count = ARRAY_SIZE(expected_setting_list);
 
 /* Test regulator list autoset method */
-static int dm_test_power_regulator_autoset_list(struct dm_test_state *dms)
+static int dm_test_power_regulator_autoset_list(struct unit_test_state *uts)
 {
        struct udevice *dev_list[2], *dev;
        int i;