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devres: add debug command to dump device resources
[oweals/u-boot.git]
/
test
/
dm
/
i2c.c
diff --git
a/test/dm/i2c.c
b/test/dm/i2c.c
index ef88372d56361ab40186a34787cc6c7a8e0c40d4..23d612eb81eb77368181891a3ef123d51d88bbcd 100644
(file)
--- a/
test/dm/i2c.c
+++ b/
test/dm/i2c.c
@@
-10,19
+10,19
@@
#include <dm.h>
#include <fdtdec.h>
#include <i2c.h>
#include <dm.h>
#include <fdtdec.h>
#include <i2c.h>
+#include <asm/state.h>
+#include <asm/test.h>
#include <dm/device-internal.h>
#include <dm/test.h>
#include <dm/uclass-internal.h>
#include <dm/device-internal.h>
#include <dm/test.h>
#include <dm/uclass-internal.h>
-#include <dm/ut.h>
#include <dm/util.h>
#include <dm/util.h>
-#include <asm/state.h>
-#include <asm/test.h>
+#include <test/ut.h>
static const int busnum;
static const int chip = 0x2c;
/* Test that we can find buses and chips */
static const int busnum;
static const int chip = 0x2c;
/* Test that we can find buses and chips */
-static int dm_test_i2c_find(struct
dm_test_state *dm
s)
+static int dm_test_i2c_find(struct
unit_test_state *ut
s)
{
struct udevice *bus, *dev;
const int no_chip = 0x10;
{
struct udevice *bus, *dev;
const int no_chip = 0x10;
@@
-43,7
+43,7
@@
static int dm_test_i2c_find(struct dm_test_state *dms)
}
DM_TEST(dm_test_i2c_find, DM_TESTF_SCAN_PDATA | DM_TESTF_SCAN_FDT);
}
DM_TEST(dm_test_i2c_find, DM_TESTF_SCAN_PDATA | DM_TESTF_SCAN_FDT);
-static int dm_test_i2c_read_write(struct
dm_test_state *dm
s)
+static int dm_test_i2c_read_write(struct
unit_test_state *ut
s)
{
struct udevice *bus, *dev;
uint8_t buf[5];
{
struct udevice *bus, *dev;
uint8_t buf[5];
@@
-60,25
+60,29
@@
static int dm_test_i2c_read_write(struct dm_test_state *dms)
}
DM_TEST(dm_test_i2c_read_write, DM_TESTF_SCAN_PDATA | DM_TESTF_SCAN_FDT);
}
DM_TEST(dm_test_i2c_read_write, DM_TESTF_SCAN_PDATA | DM_TESTF_SCAN_FDT);
-static int dm_test_i2c_speed(struct
dm_test_state *dm
s)
+static int dm_test_i2c_speed(struct
unit_test_state *ut
s)
{
struct udevice *bus, *dev;
uint8_t buf[5];
ut_assertok(uclass_get_device_by_seq(UCLASS_I2C, busnum, &bus));
{
struct udevice *bus, *dev;
uint8_t buf[5];
ut_assertok(uclass_get_device_by_seq(UCLASS_I2C, busnum, &bus));
+
+ /* Use test mode so we create the required errors for invalid speeds */
+ sandbox_i2c_set_test_mode(bus, true);
ut_assertok(i2c_get_chip(bus, chip, 1, &dev));
ut_assertok(i2c_get_chip(bus, chip, 1, &dev));
- ut_assertok(i2c_set_bus_speed(bus, 100000));
+ ut_assertok(
dm_
i2c_set_bus_speed(bus, 100000));
ut_assertok(dm_i2c_read(dev, 0, buf, 5));
ut_assertok(dm_i2c_read(dev, 0, buf, 5));
- ut_assertok(i2c_set_bus_speed(bus, 400000));
- ut_asserteq(400000, i2c_get_bus_speed(bus));
+ ut_assertok(
dm_
i2c_set_bus_speed(bus, 400000));
+ ut_asserteq(400000,
dm_
i2c_get_bus_speed(bus));
ut_assertok(dm_i2c_read(dev, 0, buf, 5));
ut_asserteq(-EINVAL, dm_i2c_write(dev, 0, buf, 5));
ut_assertok(dm_i2c_read(dev, 0, buf, 5));
ut_asserteq(-EINVAL, dm_i2c_write(dev, 0, buf, 5));
+ sandbox_i2c_set_test_mode(bus, false);
return 0;
}
DM_TEST(dm_test_i2c_speed, DM_TESTF_SCAN_PDATA | DM_TESTF_SCAN_FDT);
return 0;
}
DM_TEST(dm_test_i2c_speed, DM_TESTF_SCAN_PDATA | DM_TESTF_SCAN_FDT);
-static int dm_test_i2c_offset_len(struct
dm_test_state *dm
s)
+static int dm_test_i2c_offset_len(struct
unit_test_state *ut
s)
{
struct udevice *bus, *dev;
uint8_t buf[5];
{
struct udevice *bus, *dev;
uint8_t buf[5];
@@
-95,18
+99,22
@@
static int dm_test_i2c_offset_len(struct dm_test_state *dms)
}
DM_TEST(dm_test_i2c_offset_len, DM_TESTF_SCAN_PDATA | DM_TESTF_SCAN_FDT);
}
DM_TEST(dm_test_i2c_offset_len, DM_TESTF_SCAN_PDATA | DM_TESTF_SCAN_FDT);
-static int dm_test_i2c_probe_empty(struct
dm_test_state *dm
s)
+static int dm_test_i2c_probe_empty(struct
unit_test_state *ut
s)
{
struct udevice *bus, *dev;
ut_assertok(uclass_get_device_by_seq(UCLASS_I2C, busnum, &bus));
{
struct udevice *bus, *dev;
ut_assertok(uclass_get_device_by_seq(UCLASS_I2C, busnum, &bus));
+
+ /* Use test mode so that this chip address will always probe */
+ sandbox_i2c_set_test_mode(bus, true);
ut_assertok(dm_i2c_probe(bus, SANDBOX_I2C_TEST_ADDR, 0, &dev));
ut_assertok(dm_i2c_probe(bus, SANDBOX_I2C_TEST_ADDR, 0, &dev));
+ sandbox_i2c_set_test_mode(bus, false);
return 0;
}
DM_TEST(dm_test_i2c_probe_empty, DM_TESTF_SCAN_PDATA | DM_TESTF_SCAN_FDT);
return 0;
}
DM_TEST(dm_test_i2c_probe_empty, DM_TESTF_SCAN_PDATA | DM_TESTF_SCAN_FDT);
-static int dm_test_i2c_bytewise(struct
dm_test_state *dm
s)
+static int dm_test_i2c_bytewise(struct
unit_test_state *ut
s)
{
struct udevice *bus, *dev;
struct udevice *eeprom;
{
struct udevice *bus, *dev;
struct udevice *eeprom;
@@
-161,7
+169,7
@@
static int dm_test_i2c_bytewise(struct dm_test_state *dms)
}
DM_TEST(dm_test_i2c_bytewise, DM_TESTF_SCAN_PDATA | DM_TESTF_SCAN_FDT);
}
DM_TEST(dm_test_i2c_bytewise, DM_TESTF_SCAN_PDATA | DM_TESTF_SCAN_FDT);
-static int dm_test_i2c_offset(struct
dm_test_state *dm
s)
+static int dm_test_i2c_offset(struct
unit_test_state *ut
s)
{
struct udevice *eeprom;
struct udevice *dev;
{
struct udevice *eeprom;
struct udevice *dev;