1 /* SPDX-License-Identifier: GPL-2.0+ */
3 * linux/include/linux/mtd/bbm.h
5 * NAND family Bad Block Management (BBM) header file
6 * - Bad Block Table (BBT) implementation
8 * Copyright © 2005 Samsung Electronics
9 * Kyungmin Park <kyungmin.park@samsung.com>
11 * Copyright © 2000-2005
12 * Thomas Gleixner <tglx@linuxtronix.de>
15 #ifndef __LINUX_MTD_BBM_H
16 #define __LINUX_MTD_BBM_H
18 /* The maximum number of NAND chips in an array */
19 #ifndef CONFIG_SYS_NAND_MAX_CHIPS
20 #define CONFIG_SYS_NAND_MAX_CHIPS 1
24 * struct nand_bbt_descr - bad block table descriptor
25 * @options: options for this descriptor
26 * @pages: the page(s) where we find the bbt, used with option BBT_ABSPAGE
27 * when bbt is searched, then we store the found bbts pages here.
28 * Its an array and supports up to 8 chips now
29 * @offs: offset of the pattern in the oob area of the page
30 * @veroffs: offset of the bbt version counter in the oob are of the page
31 * @version: version read from the bbt page during scan
32 * @len: length of the pattern, if 0 no pattern check is performed
33 * @maxblocks: maximum number of blocks to search for a bbt. This number of
34 * blocks is reserved at the end of the device where the tables are
36 * @reserved_block_code: if non-0, this pattern denotes a reserved (rather than
37 * bad) block in the stored bbt
38 * @pattern: pattern to identify bad block table or factory marked good /
39 * bad blocks, can be NULL, if len = 0
41 * Descriptor for the bad block table marker and the descriptor for the
42 * pattern which identifies good and bad blocks. The assumption is made
43 * that the pattern and the version count are always located in the oob area
46 struct nand_bbt_descr {
48 int pages[CONFIG_SYS_NAND_MAX_CHIPS];
51 uint8_t version[CONFIG_SYS_NAND_MAX_CHIPS];
54 int reserved_block_code;
58 /* Options for the bad block table descriptors */
60 /* The number of bits used per block in the bbt on the device */
61 #define NAND_BBT_NRBITS_MSK 0x0000000F
62 #define NAND_BBT_1BIT 0x00000001
63 #define NAND_BBT_2BIT 0x00000002
64 #define NAND_BBT_4BIT 0x00000004
65 #define NAND_BBT_8BIT 0x00000008
66 /* The bad block table is in the last good block of the device */
67 #define NAND_BBT_LASTBLOCK 0x00000010
68 /* The bbt is at the given page, else we must scan for the bbt */
69 #define NAND_BBT_ABSPAGE 0x00000020
70 /* bbt is stored per chip on multichip devices */
71 #define NAND_BBT_PERCHIP 0x00000080
72 /* bbt has a version counter at offset veroffs */
73 #define NAND_BBT_VERSION 0x00000100
74 /* Create a bbt if none exists */
75 #define NAND_BBT_CREATE 0x00000200
77 * Create an empty BBT with no vendor information. Vendor's information may be
78 * unavailable, for example, if the NAND controller has a different data and OOB
79 * layout or if this information is already purged. Must be used in conjunction
80 * with NAND_BBT_CREATE.
82 #define NAND_BBT_CREATE_EMPTY 0x00000400
83 /* Write bbt if neccecary */
84 #define NAND_BBT_WRITE 0x00002000
85 /* Read and write back block contents when writing bbt */
86 #define NAND_BBT_SAVECONTENT 0x00004000
87 /* Search good / bad pattern on the first and the second page */
88 #define NAND_BBT_SCAN2NDPAGE 0x00008000
89 /* Search good / bad pattern on the last page of the eraseblock */
90 #define NAND_BBT_SCANLASTPAGE 0x00010000
92 * Use a flash based bad block table. By default, OOB identifier is saved in
93 * OOB area. This option is passed to the default bad block table function.
95 #define NAND_BBT_USE_FLASH 0x00020000
97 * Do not store flash based bad block table marker in the OOB area; store it
100 #define NAND_BBT_NO_OOB 0x00040000
102 * Do not write new bad block markers to OOB; useful, e.g., when ECC covers
103 * entire spare area. Must be used with NAND_BBT_USE_FLASH.
105 #define NAND_BBT_NO_OOB_BBM 0x00080000
108 * Flag set by nand_create_default_bbt_descr(), marking that the nand_bbt_descr
109 * was allocated dynamicaly and must be freed in nand_release(). Has no meaning
110 * in nand_chip.bbt_options.
112 #define NAND_BBT_DYNAMICSTRUCT 0x80000000
114 /* The maximum number of blocks to scan for a bbt */
115 #define NAND_BBT_SCAN_MAXBLOCKS 4
118 * Constants for oob configuration
120 #define NAND_SMALL_BADBLOCK_POS 5
121 #define NAND_LARGE_BADBLOCK_POS 0
122 #define ONENAND_BADBLOCK_POS 0
125 * Bad block scanning errors
127 #define ONENAND_BBT_READ_ERROR 1
128 #define ONENAND_BBT_READ_ECC_ERROR 2
129 #define ONENAND_BBT_READ_FATAL_ERROR 4
132 * struct bbm_info - [GENERIC] Bad Block Table data structure
133 * @bbt_erase_shift: [INTERN] number of address bits in a bbt entry
134 * @badblockpos: [INTERN] position of the bad block marker in the oob area
135 * @options: options for this descriptor
136 * @bbt: [INTERN] bad block table pointer
137 * @isbad_bbt: function to determine if a block is bad
138 * @badblock_pattern: [REPLACEABLE] bad block scan pattern used for
139 * initial bad block scan
140 * @priv: [OPTIONAL] pointer to private bbm date
149 int (*isbad_bbt)(struct mtd_info *mtd, loff_t ofs, int allowbbt);
151 /* TODO Add more NAND specific fileds */
152 struct nand_bbt_descr *badblock_pattern;
157 /* OneNAND BBT interface */
158 extern int onenand_scan_bbt(struct mtd_info *mtd, struct nand_bbt_descr *bd);
159 extern int onenand_default_bbt(struct mtd_info *mtd);
161 #endif /* __LINUX_MTD_BBM_H */